Study of Morphology and Piezoelectric Properties of Polyvinylidene Fluoride Langmuir-Blodgett Films Using Piezoresponse Force Microscopy

Abstract

Over the past decade, one of the most important areas in science and technology development has been the design and creation of new types of sensor devices. Acousto-electronic technology is considered to be among the most promising directions for manufacturing various sensors. The next step in its evolution involves transitioning to flexible piezoelectric substrate-based sensory devices. This led to a task concerning the search and creation of flexible piezoactive materials. One such material is polyvinylidene fluoride polymer (PVDF), which exhibits high values of piezomodulus. The paper presents research results on properties of PVDF films with different thicknesses obtained using Langmuir-Blodgett technology, including those containing tetafluoroethylene copolymer. Atomic force microscopy was used to study how monomolecular layer thickness affects film morphology. Piezoelectric properties were also investigated by atomic force microscopy. It was demonstrated that films consisting of 40 layers exhibit piezoelectric properties. It should be noted that employing the Langmuir-Blodgett method when forming piezoelectric PVDF films significantly simplifies their fabrication process. Experiments have shown that polarization treatment can be omitted during production of Langmuir-type piezoelectric PVDF films. This will increase the transfer coefficient of the monolayer onto the substrate while reducing defects caused by tearing the film due to the needle-like structure of glass coated with an ITO layer. Further refinement of this technique will allow obtaining PVDF films whose piezoelectric properties are no worse than those produced by traditional methods.
The work was supported by the Ministry of Science and Higher Education of the Russian Federation (state assignment FFWZ-2024-0006).

Speaker

Ilya A. Gorbachev
IRE Kotelnikova RAS
Russia

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