Analysis of the influence of various factors on the interference colors of the image of layered structures in optical microscopy: computer modeling

Abstract

Measuring the thickness of thin objects is a task for various fields of science. These include industry, where these methods are used as control and measurement, biology and medicine. Such methods include optical methods, in particular the method of interference microscopy without a reference wave. The method consists in obtaining the dependence of the color distribution in the RGB palette on the optical thickness of the object. Further, the obtained dependence is used to solve the inverse task of measuring the optical thickness of the object under study by interference colors. One of the important limitations of this method is the maximum allowable optical thickness of the object under study. Since the object is viewed in reflected light, its optical thickness for obtaining a contrasting image should not exceed half the coherence length of the incident radiation.
In this paper, using numerical modeling, the factors affecting the parameters of the color interference image of a layered object are considered, and the most significant of them are highlighted. The data obtained allow us to identify a number of factors that must first be taken into account when measuring the thickness of a layered object by interference microscopy without a reference wave.

Speaker

Arseniy Fashchevskiy
Saratov State University
Russia

Discussion

Ask question